1. Accelerating test, validation and debug of high speed serial interface
Author: / Yongquan Fan, Zeljko Zilic
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject: Interface circuits--Testing,Very high speed integrated circuits--Testing
Classification :
TK
,
7868
,.
I58
,
F36
,
2011
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2. Accelerating test, validation and debug of high speed serial interfaces
Author:
Library: Central Library and Documents Center of Mazandaran University (Mazandaran)
Subject: Interface circuits ; Testing. ; Very high speed integrated circuits ; Testing. ;
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